Implied-voc and Suns-voc Measurements in Multicrystalline Solar Cells

Identifying loss mechanisms and predicting device performance are key goals of device and process characterization. Photoconductance measurements allow the extraction of the Implied Voc and Suns Voc, which together can be used for process monitoring, for loss analysis and to identify the potential device performance in the absence of unwanted defects. In this paper, we measure the Implied Voc and Suns Voc from solar cells with a range of different substrates and at different stages in processing. These measurements are used to analyze the correlation with the actual Voc to determine the impact of both non-idealities such as depletion region recombination, and expected effects such as lifetime changes, both during processing and in the final devices.